A hard x-ray scanning microprobe for fluorescence imaging and microdiffraction at the Advanced Photon Source

Conference · Tue Nov 02 00:00:00 EST 1999

OSTI ID:750575

Cai, L; Lai, B; Yun, W; Ilinski, P; Legnini, D; Maser, J; Rodrigues, W

A hard x-ray scanning microprobe based on zone plate optics and undulator radiation, in the energy region from 6 to 20 keV, has reached a focal spot size (FWHM) of 0.15 {micro}m (v) x 0.6 {micro}m (h), and a photon flux of 4 x 10{sup 9} photons/sec/0.01%BW. Using a slit 44 meters upstream to create a virtual source, a circular beam spot of 0.15 {micro}m in diameter can be obtained with a photon flux of one order of magnitude less. During fluorescence mapping of trace elements in a single human ovarian cell, the microprobe exhibited an imaging sensitivity for Pt (L{sub a} line) of 80 attograms/{micro}m{sup 2} for a count rate of 10 counts per second. The x-ray microprobe has been used to map crystallographic strain and multiquantum well thickness in micro-optoelectronic devices produced with the selective area growth technique.

• Research Organization: Argonne National Lab., IL (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 750575
• Report Number(s): ANL/XFD/CP-100395; TRN: US0003506
• Resource Relation: Conference: XRM '99, Berkeley, CA (US), 06/04/1999--06/05/1999; Other Information: PBD: 2 Nov 1999
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADVANCED PHOTON SOURCE
ACCELERATOR FACILITIES
USES
X-RAY FLUORESCENCE ANALYSIS
MICROANALYSIS
X-RAY DIFFRACTION
OPTICAL SYSTEMS
TRACE AMOUNTS
SENSITIVITY
MICROSCOPY