Use of the high-energy x-ray microprobe at the Advanced Photon Source to investigate the interactions between metals and bacteria.
Understanding the fate of heavy-metal contaminants in the environment is of fundamental importance in the development and evaluation of effective remediation and sequestration strategies. Among the factors influencing the transport of these contaminants are their chemical separation and the chemical and physical attributes of the surrounding medium. Bacteria and the extracellular material associated with them are thought to play a key role in determining a contaminant's speciation and thus its mobility in the environment. In addition, the microenvironment at and adjacent to actively metabolizing cell surfaces can be significantly different from the bulk environment. Thus, the spatial distribution and chemical separation of contaminants and elements that are key to biological processes must be characterized at micron and submicron resolution in order to understand the microscopic physical, geological, chemical, and biological interfaces that determine a contaminant's macroscopic fate. Hard X-ray microimaging is a powerful technique for the element-specific investigation of complex environmental samples at th needed micron and submicron resolution. An important advantage of this technique results from the large penetration depth of hard X-rays in water. This advantage minimizes the requirements for sample preparation and allows the detailed study of hydrated samples. This paper presents results of studies of the spatial distribution of naturally occurring metals and a heavy-metal contaminant (Cr) in and near hydrated bacteria (Pseudomonas fluorescens) in the early stages of biofilm development, performed at the Advanced Photon Source Sector 2 X-ray microscopy beamline.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 750462
- Report Number(s):
- ANL/ER/CP-99114; TRN: US0204605
- Resource Relation:
- Conference: 6th International X-ray Microscopy Conference, Berkeley, CA (US), 08/01/1999--08/06/1999; Other Information: PBD: 30 Sep 1999
- Country of Publication:
- United States
- Language:
- English
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