Defect Dependent Elasticity: Nanoindentation as a Probe of Stress-State
Nanoindentation studies reveal that the measured elastic properties of materials can be strongly dependent upon their stress-state and defect structure. Using an interfacial force microscope (IFM), the measured elastic response of 100 nm thick Au films was found to be strongly correlated with the films' stress state and thermal history. Indentation elasticity was also found to vary in close proximity to grain boundaries in thin films and near surface steps on single crystal surfaces. Molecular dynamics simulations suggest that these results cannot be explained by elasticity due only to bond stretching. Instead, the measured elastic properties appear to be a combination of bond and defect compliance representing a composite modulus. We propose that stress concentration arising from the structure of grains, voids and grain boundaries is the source of an additional compliance which is sensitive to the stress state and thermal history of a material. The elastic properties of thin metallic films appear to reflect the collective elastic response of the grains, voids and grain boundaries. These results demonstrate that nanoindentation can be useful as a highly localized probe of stress-state and defect structures.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 750315
- Report Number(s):
- SAND2000-0160J; TRN: US200221%%288
- Journal Information:
- Journal of Materials Research, Other Information: Submitted to Journal of Materials Research; PBD: 18 Jan 2000
- Country of Publication:
- United States
- Language:
- English
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