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Title: Radiation Effects in the Space Telecommunications Environment

Journal Article · · Microelectronics Reliability

Trapped protons and electrons in the Earth's radiation belts and cosmic rays present significant challenges for electronics that must operate reliably in the natural space environment. Single event effects (SEE) can lead to sudden device or system failure, and total dose effects can reduce the lifetime of a telecommmiications system with significant space assets. One of the greatest sources of uncertainty in developing radiation requirements for a space system is accounting for the small but finite probability that the system will be exposed to a massive solar particle event. Once specifications are decided, standard laboratory tests are available to predict the total dose response of MOS and bipolar components in space, but SEE testing of components can be more challenging. Prospects are discussed for device modeling and for the use of standard commercial electronics in space.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
7051
Report Number(s):
SAND99-1233J; ON: DE00007051
Journal Information:
Microelectronics Reliability, Journal Name: Microelectronics Reliability
Country of Publication:
United States
Language:
English

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