Equivalent beam averaging (EBA) of I-V spectra for LEED analysis
An equivalent beam averaging (EBA) procedure is described which has proved to be very useful to enhance I-V profile data collected for LEED analyses. Specific analyses are documented where application of EBA has led to improved agreement between calculated and experimental I-V profiles. The procedure also has been substantiated by examination of representative I-V profiles which were calculated to correspond to the incident beam slightly misaligned from, and exactly aligned with, the surface normal. It then has been inferred from such substanstiation that use of EBA in a LEED analysis reduces the effects of systematic experimental errors caused by minor misalignment of the incident beam, beam divergence, and certain surface morphologies.
- Research Organization:
- Oak Ridge National Lab., TN (USA)
- DOE Contract Number:
- W-7405-ENG-26
- OSTI ID:
- 6939324
- Report Number(s):
- CONF-820870-1-Draft; ON: DE82020829
- Resource Relation:
- Conference: Nordic conference on surface science, Tampere, Finland, 18 Aug 1982
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
COPPER
CRYSTAL STRUCTURE
ELECTRON DIFFRACTION
ELECTRON MICROPROBE ANALYSIS
METALS
BEAM PROFILES
DATA ANALYSIS
ELECTRON BEAMS
SURFACES
BEAMS
CHEMICAL ANALYSIS
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
LEPTON BEAMS
MICROANALYSIS
PARTICLE BEAMS
SCATTERING
TRANSITION ELEMENTS
400103* - Radiometric & Radiochemical Procedures- (-1987)
360102 - Metals & Alloys- Structure & Phase Studies