Growth Mechanisms and Characterization of Hydrogenated Amorphous-Silicon-Alloy Films, Annual Subcontract Report, 14 February 1991 - 13 February 1992

Technical Report · Mon Feb 01 00:00:00 EST 1993

DOI:https://doi.org/10.2172/6873153· OSTI ID:6873153

Gallagher, A.; Ostrom, R.; Stutzin, G.; Tanenbaum, D.

This report describes an apparatus, constructed and tested, that allows measurement of the surface morphology of as-grown hydrogenated amorphous silicon films with atomic resolution using a scanning tunneling microscope. Surface topologies of 100-[degree][Lambda]-thick intrinsic films, deposited on atomically flat, crystalline Si and GaAs, are reported. These films surfaces are relatively flat on the atomic scale, indicating fairly homogeneous, compact initial film growth. The effect of probe-tip size on the observed topology and the development of atomically sharp probes is discussed. 17 refs, 9 figs.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 6873153
• Report Number(s): NREL/TP-411-5326; ON: DE93000071
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
SILICON
DEPOSITION
SURFACE PROPERTIES
AMORPHOUS STATE
GLOW DISCHARGES
HYDROGENATION
MICROSCOPY
MORPHOLOGY
PROBES
PROGRESS REPORT
SILICON SOLAR CELLS
THIN FILMS
TOPOLOGY
TUNNEL EFFECT
CHEMICAL REACTIONS
DIRECT ENERGY CONVERTERS
DOCUMENT TYPES
ELECTRIC DISCHARGES
ELEMENTS
EQUIPMENT
FILMS
MATHEMATICS
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
SEMIMETALS
SOLAR CELLS
SOLAR EQUIPMENT
photovoltaics
solar cells
amorphous silicon
alloy
films
140501* - Solar Energy Conversion- Photovoltaic Conversion
360602 - Other Materials- Structure & Phase Studies