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Title: Wavelength dispersing devices for soft and ultrasoft x-ray spectrometers

Abstract

Monochromatization combining total reflection by a selected mirror and an appropriate filter offered an alternative approach in order to increase measurable intensity with reasonable spectral resolution. Recently, the use of synthetic multilayers, which are prepared by sputter/evaporation techniques, has been introduced for the detection of soft and ultrasoft x-rays. Studies on the use of these new wavelength dispersing devices have been conducted and it has been found that the reflectivity of these devices is very high compared with single crystals and soap multilayers and that their resolving power is fairly good. This report makes comparisons regarding efficiency of reflection, resolving power and x-ray analytical problems for practical applications among long spacing single crystals, soap multilayers, total reflection combined with a selected mirror and filtering and synthetic multilayers. The x-ray analytical capablities are shown based upon a standard x-ray fluorescence spectrometer equipped with a sealed-off x-ray tube and a gas flow proportional counter with thin film detector window.

Authors:
; ;
Publication Date:
Research Org.:
Rigaku Industrial Corp., Takasuki Osaka (Japan); Lawrence Livermore National Lab., CA (USA)
OSTI Identifier:
6869222
Report Number(s):
UCRL-92052; CONF-840799-4
ON: DE87007327
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: Advances in x-ray analysis conference, Denver, CO, USA, 30 Jul 1984; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS; LAYERS; REFLECTION; SOFT X RADIATION; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTROMETERS; X RADIATION; X-RAY EMISSION ANALYSIS; 400101* - Activation, Nuclear Reaction, Radiometric & Radiochemical Procedures

Citation Formats

Arai, Tomoya, Ryon, R W, and Shoji, Takashi. Wavelength dispersing devices for soft and ultrasoft x-ray spectrometers. United States: N. p., 1984. Web.
Arai, Tomoya, Ryon, R W, & Shoji, Takashi. Wavelength dispersing devices for soft and ultrasoft x-ray spectrometers. United States.
Arai, Tomoya, Ryon, R W, and Shoji, Takashi. 1984. "Wavelength dispersing devices for soft and ultrasoft x-ray spectrometers". United States. https://www.osti.gov/servlets/purl/6869222.
@article{osti_6869222,
title = {Wavelength dispersing devices for soft and ultrasoft x-ray spectrometers},
author = {Arai, Tomoya and Ryon, R W and Shoji, Takashi},
abstractNote = {Monochromatization combining total reflection by a selected mirror and an appropriate filter offered an alternative approach in order to increase measurable intensity with reasonable spectral resolution. Recently, the use of synthetic multilayers, which are prepared by sputter/evaporation techniques, has been introduced for the detection of soft and ultrasoft x-rays. Studies on the use of these new wavelength dispersing devices have been conducted and it has been found that the reflectivity of these devices is very high compared with single crystals and soap multilayers and that their resolving power is fairly good. This report makes comparisons regarding efficiency of reflection, resolving power and x-ray analytical problems for practical applications among long spacing single crystals, soap multilayers, total reflection combined with a selected mirror and filtering and synthetic multilayers. The x-ray analytical capablities are shown based upon a standard x-ray fluorescence spectrometer equipped with a sealed-off x-ray tube and a gas flow proportional counter with thin film detector window.},
doi = {},
url = {https://www.osti.gov/biblio/6869222}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1984},
month = {Sun Jan 01 00:00:00 EST 1984}
}

Conference:
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