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Title: Microwave properties of HTS (high temperature superconductor) films

Conference ·
OSTI ID:6825881
; ; ; ; ; ; ; ; ; ;  [1];  [2];  [3];  [4]
  1. Los Alamos National Lab., NM (USA)
  2. California Univ., Berkeley, CA (USA)
  3. Hewlett-Packard Corp., Palo Alto, CA (USA). Labs.
  4. General Electric Co., Schenectady, NY (USA). Corporate Research and Development Ce

High-frequency applications of high-temperature superconductors generally fall into two categories: devices that require low values of surface resistance R{sub s} in ambient surface magnetic fields H{sub rf}, and devices that require low R{sub s} in modest fields. Moreover, many applications can be realized with small-surface-area films whereas others require larger areas-radiofrequency (rf) cavities, for example. Regardless of the application, the potential of HTS films is predicated on satisfying one or both of the above-stated requirements. We have measured the surface resistance of small-area (1 cm{sup 2}) and large-area (6.5 cm{sup 2}) YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) films that have been laser ablated onto LaA{ell}O{sub 3} substrates, large-area (5.1 cm{sup 2}) YBCO films that have been e-beam deposited onto LaA{ell}O{sub 3}, and large-area (11.4 cm{sup 2}) T{ell}-based films that have been magnetron sputtered onto metallic substrates. The best R{sub s} values are obtained from the 1-cm{sup 2} laser-ablated films; they are 40 {mu}{Omega} and 340 {mu}{Omega} at 4 K and 77 K, respectively ({omega}/2{pi} = 10 GHz). Comparable values for Cu are 6 and 13 m{Omega}, respectively. Large-area T{ell}-based films yield typical R{sub s} values of 4 m{Omega} and 14 m{Omega} at 4 K and 77 K, respectively ({omega}/2{pi} = 18 GHz). The dependence of R{sub s} on H{sub rf} for these films indicates that surface fields as large as 55 Oe can be achieved with R{sub s} increasing only by a factor of 10. This field dependence is associated with c-axis texturing.

Research Organization:
Los Alamos National Lab., NM (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
W-7405-ENG-36; AC03-76SF00098
OSTI ID:
6825881
Report Number(s):
LA-UR-90-3268; CONF-901105-12; ON: DE91000211
Resource Relation:
Conference: Fall meeting of the Materials Research Society, Boston, MA (USA), 24 Nov - 1 Dec 1990
Country of Publication:
United States
Language:
English