High resolution interface nanochemistry and structure
A summary is given of results on nanospectroscopy etc. during the previous three years, divided into the following subsections: development of methods and instrumentation for interface/boundary chemical analysis, interface and boundary structure in ceramic matrix composites, quantitative composition measurements of thin films and inclusions, theoretical calculations for electron energy loss near edge fine structure and grain boundary structure, and small probe radiation effects in ceramics. Materials studied include SiC whisker-reinforced Si3N4, SiC, Si oxides, Si, Si oxynitride, other ceramics. Methods mentioned include field emission, EELS (electron energy loss spectroscopy), nanospectroscopy, electron nanoprobe, etc.
- Research Organization:
- Arizona State Univ., Tempe, AZ (United States)
- Sponsoring Organization:
- USDOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- FG02-87ER45305
- OSTI ID:
- 6726293
- Report Number(s):
- DOE/ER/45305-T2; ON: DE93009750
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
CERAMICS
ENERGY-LOSS SPECTROSCOPY
COMPOSITE MATERIALS
SPECTROSCOPY
FIELD EMISSION
GRAIN BOUNDARIES
INCLUSIONS
INTERFACES
MICROSCOPY
MICROSTRUCTURE
PROGRESS REPORT
SILICON
SILICON CARBIDES
SILICON NITRIDES
SILICON OXIDES
THIN FILMS
WHISKERS
CARBIDES
CARBON COMPOUNDS
CHALCOGENIDES
CRYSTAL STRUCTURE
CRYSTALS
DOCUMENT TYPES
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
FILMS
MATERIALS
MONOCRYSTALS
NITRIDES
NITROGEN COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
PNICTIDES
SEMIMETALS
SILICON COMPOUNDS
400101* - Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
360202 - Ceramics
Cermets
& Refractories- Structure & Phase Studies