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Title: Soft x-ray laser microscopy

Conference ·
OSTI ID:6703239
 [1]; ; ;  [2]; ;  [3]
  1. Princeton X-Ray Laser, Inc., Monmouth Junction, NJ (United States)
  2. Princeton Univ., NJ (United States). Plasma Physics Lab.
  3. Miami Univ., Coral Gables, FL (United States). Dept. of Physics

Microscopes based on soft X-ray lasers possess unique advantages in bridging the gap between high resolution electron microscopy of dehydrated, stained cells and light microscopy at comparatively low resolution of unaltered live cells. The high brightness and short pulse duration of soft X-ray lasers make them ideal for flash imaging of live specimens. The Princeton soft X-ray laser is based on a magnetically confined laser produced carbon plasma. Radiation cooling after the laser pulse produces rapid recombination which produces a population inversion and high gain. A full account is given in a companion paper in this volume. The important characteristics of the laser beam produced by this device are 1 to 3 mJ of 18.2 nm radiation in a 10 to 30 nsec pulse with a divergence of 5 mrad. The 18.2 nm wavelength, while outside the water window, does provide a factor of 3 difference in absorption coefficients between oxygen and carbon.

Research Organization:
Princeton Univ., NJ (United States). Plasma Physics Lab.
Sponsoring Organization:
USDOE; USDOD; USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
DOE Contract Number:
FG02-86ER13609
OSTI ID:
6703239
Report Number(s):
CONF-8708180-15; ON: DE93007317
Resource Relation:
Conference: Symposium on X-ray microscopy, Upton, NY (United States), 31 Aug - 4 Sep 1987
Country of Publication:
United States
Language:
English