Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980

Sopori, B

doi:10.2172/6620390

Title: Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980

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Abstract

Major accomplishments during the first quarter of the contract period are reported. Small area diode fabrication and analysis has been continued. This technique has further been applied to many RTR ribbons. An optical technique for determination of crystallite orientations has been placed in operation. This technique has many distinct advantages. These are: (1) rapid; (2) can be set-up very inexpensively; (3) well suited for polycrystalline substrates of small grain size; and (4) can easily characterize twins. Accuracies obtained with this technique are about the same as that of the Laue technique. A technique to qualitatively evaluate grain boundary activity in unprocessed substrates has been used and valuable results obtained. Further analysis is being done to use this technique for quantitative evaluation. A major study of G.B. orientation effects is underway. Initial results on RTR ribbons have shown a good correlation of G.B. barrier height with misorientation (tilt boundaries).

Authors:: Sopori, B

Publication Date:: Wed Jul 30 00:00:00 EDT 1980

Research Org.:: Motorola, Inc., Phoenix, AZ (USA). Solar Energy Dept.

Sponsoring Org.:: USDOE, Office of Solar Energy

OSTI Identifier:: 6620390

Report Number(s):: DOE/SERI-9234/1

DOE Contract Number:: AC02-77CH00178

Resource Type:: Technical Report

Country of Publication:: United States

Language:: English

Subject:: 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; SILICON; GRAIN BOUNDARIES; GRAIN ORIENTATION; SILICON SOLAR CELLS; FABRICATION; CRYSTAL DEFECTS; ELECTRICAL PROPERTIES; ETCHING; PERFORMANCE; POLYCRYSTALS; RECOMBINATION; SUBSTRATES; CRYSTAL STRUCTURE; CRYSTALS; DIRECT ENERGY CONVERTERS; ELEMENTS; EQUIPMENT; MICROSTRUCTURE; ORIENTATION; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; SEMIMETALS; SOLAR CELLS; SOLAR EQUIPMENT; SURFACE FINISHING; silicon solar cells; silicon; polycrystals; grain boundaries; crystal defects; grain orientation; recombination; fabrication; etching; substrates; performance; electrical properties; 140501* - Solar Energy Conversion- Photovoltaic Conversion; 360601 - Other Materials- Preparation & Manufacture

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                    Sopori, B. Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980.  United States: N. p., 1980. 
        Web.  doi:10.2172/6620390.

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                    Sopori, B. Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980.  United States.  https://doi.org/10.2172/6620390

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                    Sopori, B. 1980.  
        "Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980".  United States.  https://doi.org/10.2172/6620390.  https://www.osti.gov/servlets/purl/6620390.

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@article{osti_6620390,

  title        = {Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980},

  author       = {Sopori, B},

  abstractNote = {Major accomplishments during the first quarter of the contract period are reported. Small area diode fabrication and analysis has been continued. This technique has further been applied to many RTR ribbons. An optical technique for determination of crystallite orientations has been placed in operation. This technique has many distinct advantages. These are: (1) rapid; (2) can be set-up very inexpensively; (3) well suited for polycrystalline substrates of small grain size; and (4) can easily characterize twins. Accuracies obtained with this technique are about the same as that of the Laue technique. A technique to qualitatively evaluate grain boundary activity in unprocessed substrates has been used and valuable results obtained. Further analysis is being done to use this technique for quantitative evaluation. A major study of G.B. orientation effects is underway. Initial results on RTR ribbons have shown a good correlation of G.B. barrier height with misorientation (tilt boundaries).},

  doi          = {10.2172/6620390},

  url          = {https://www.osti.gov/biblio/6620390},
  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Wed Jul 30 00:00:00 EDT 1980},

  month        = {Wed Jul 30 00:00:00 EDT 1980}

}

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