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Title: Orientation-dependent critical currents in Y sub 1 Ba sub 2 Cu sub 3 O sub 7-x epitaxial thin films: Evidence for intrinsic flux pinning

Conference ·
OSTI ID:6543371
; ; ; ; ; ; ; ;  [1];  [2]
  1. Oak Ridge National Lab., TN (USA)
  2. Thomas J. Watson Research Center, Yorktown Heights, NY (USA)

For YBCO epitaxial thin films the basal plane transport critical current density J{sub c}, flowing perpendicular to an applied magnetic field H, depends sensitively on the orientation of the crystal with respect to H. In particular, J{sub c} is sharply peaked and greatly enhanced when H is precisely parallel to the copper-oxygen planes. Experiments on a series of epitaxial monolithic and superconductor-insulator multilayer thin films provide clear evidence that the enhancement is a bulk, rather than surface or thin sample, phenomenon. Measurements of the orientation dependence are presented and compared with a model of intrinsic flux pinning'' by the layered crystal structure.

Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6543371
Report Number(s):
CONF-900990-1; ON: DE91001518
Resource Relation:
Conference: 4. annual conference on superconductivity and applications, Buffalo, NY (USA), 18-20 Sep 1990
Country of Publication:
United States
Language:
English