X-ray reflectivity and surface roughness

Conference · Fri Jan 01 00:00:00 EST 1988

OSTI ID:6507489

Ocko, B M

Since the advent of high brightness synchrotron radiation sources there has been a phenomenal growth in the use of x-rays as a probe of surface structure. The technique of x-ray reflectivity is particularly relevant to electrochemists since it is capable of probing the structure normal to an electrode surface in situ. In this paper the theoretical framework for x-ray reflectivity is reviewed and the results from previous non-electrochemistry measurements are summarized. These measurements are from the liquid/air interface (CCl/sub 4/), the metal crystal vacuum interface (Au(100)), and from the liquid/solid interface(liquid crystal/silicon). 34 refs., 5 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6507489
• Report Number(s): BNL-42064; CONF-8807142-1; ON: DE89004519
• Resource Relation: Conference: NATO advanced study institute conference, Canary Islands, Spain, 3 Jul 1988; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CARBON TETRACHLORIDE
REFLECTIVITY
GOLD
LIQUID CRYSTALS
SURFACES
ROUGHNESS
MOMENTUM TRANSFER
SURFACE PROPERTIES
SYNCHROTRON RADIATION SOURCES
X RADIATION
X-RAY SOURCES
CHLORINATED ALIPHATIC HYDROCARBONS
CRYSTALS
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
FLUIDS
HALOGENATED ALIPHATIC HYDROCARBONS
IONIZING RADIATIONS
LIQUIDS
METALS
OPTICAL PROPERTIES
ORGANIC CHLORINE COMPOUNDS
ORGANIC COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
PHYSICAL PROPERTIES
RADIATION SOURCES
RADIATIONS
TRANSITION ELEMENTS
X-RAY EQUIPMENT
360104* - Metals & Alloys- Physical Properties
360603 - Materials- Properties
656003 - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)