Aberration analysis calculations for synchrotron radiation beamline design
Conference
·
OSTI ID:650352
The application of ray deviation calculations based on aberration coefficients for a single optical surface for the design of beamline optical systems is reviewed. A systematic development is presented which allows insight into which aberration may be causing the rays to deviate from perfect focus. A new development allowing analytical calculation of line shape is presented.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 650352
- Report Number(s):
- LBNL-40850; LSBL-415; CONF-970706-; ON: DE98052840; TRN: 98:010252
- Resource Relation:
- Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997; Other Information: PBD: Sep 1997
- Country of Publication:
- United States
- Language:
- English
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