Threshold energy surface and Frenkel-pair resistivity for Cu

Conference · Fri Jan 01 00:00:00 EST 1982

OSTI ID:6436055

King, W E; Merkle, K L; Meshii, M

In-situ electrical resistivity damage-rate measurements in the high voltage electron microscope have been used to study electron-irradiation-induced defect production in copper single crystals at T < 10/sup 0/K. Analysis of the directional and energy dependence yields a threshold energy surface that is significantly different from those of previous investigations: two pockets of low threshold energy centered at <100> and <110> surrounded by regions of much higher threshold energy. The corresponding damage function exhibits a plateau of 0.6 Frenkel pairs. the present results imply a Frenkel pair resistivity for C of (2.75/sub -0.2//sup +0.6/) x ..cap omega..-cm.

• Research Organization: Argonne National Lab., IL (USA); Northwestern Univ., Evanston, IL (USA)
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 6436055
• Report Number(s): CONF-821049-18; ON: DE83008694
• Resource Relation: Conference: TMS/AIME fall meeting, St. Louis, MO, USA, 24 Oct 1982
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COPPER
PHYSICAL RADIATION EFFECTS
DAMAGE
ELECTRON BEAMS
ELECTRON MICROSCOPY
FRENKEL DEFECTS
MONOCRYSTALS
THRESHOLD ENERGY
ULTRALOW TEMPERATURE
BEAMS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
CRYSTALS
ELEMENTS
ENERGY
LEPTON BEAMS
METALS
MICROSCOPY
PARTICLE BEAMS
POINT DEFECTS
RADIATION EFFECTS
TRANSITION ELEMENTS
VACANCIES
360106* - Metals &amp; Alloys- Radiation Effects