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Title: Study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica

Abstract

A damage morphology study was performed with a 355 nm Nd:YAG laser on synthetic UV-grade fused silica to determine the effects of post- polish chemical etching on laser-induced damage, compare damage morphologies of cleaved and polished surfaces, and understand the effects of the hydrolyzed surface layer and waste-crack interactions. The samples were polished , then chemically etched in buffered HF solution to remove 45,90,135, and 180 nm of surface material. Another set of samples was cleaved and soaked in boiling distilled water for 1 second and 1 hour. All the samples were irradiated at damaging fluencies and characterized by Normarski optical microscopy and scanning electron microscopy. Damage was initiated as micro-pits on both input and output surfaces of the polished fused silica sample. At higher fluencies, the micro-pits generated cracks on the surface. Laser damage of the polished surface showed significant trace contamination levels within a 50 nm surface layer. Micro-pit formation also appeared after irradiating cleaved fused silica surfaces at damaging fluences. Linear damage tracks corresponding cleaving tracks were often observed on cleaved surfaces. Soaking cleaved samples in water produced wide laser damage tracks.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
641346
Report Number(s):
UCRL-JC-129275; CONF-9710116-
ON: DE98052069; BR: DP0212000; CNN: W-7405-Eng-48
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: 29. annual Boulder damage symposium on optical materials for high power lasers, Boulder, CO (United States), 6-8 Oct 1997; Other Information: PBD: 23 Dec 1997
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; SILICA; PITTING CORROSION; LASER RADIATION; ELECTRON MICROSCOPY; SURFACE PROPERTIES

Citation Formats

Yoshiyama, J, Genin, F Y, Salleo, A, Thomas, I, Kozlowski, M R, Sheehan, L M, Hutcheon, I D, and Camp, D W. Study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica. United States: N. p., 1997. Web.
Yoshiyama, J, Genin, F Y, Salleo, A, Thomas, I, Kozlowski, M R, Sheehan, L M, Hutcheon, I D, & Camp, D W. Study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica. United States.
Yoshiyama, J, Genin, F Y, Salleo, A, Thomas, I, Kozlowski, M R, Sheehan, L M, Hutcheon, I D, and Camp, D W. 1997. "Study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica". United States. https://www.osti.gov/servlets/purl/641346.
@article{osti_641346,
title = {Study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica},
author = {Yoshiyama, J and Genin, F Y and Salleo, A and Thomas, I and Kozlowski, M R and Sheehan, L M and Hutcheon, I D and Camp, D W},
abstractNote = {A damage morphology study was performed with a 355 nm Nd:YAG laser on synthetic UV-grade fused silica to determine the effects of post- polish chemical etching on laser-induced damage, compare damage morphologies of cleaved and polished surfaces, and understand the effects of the hydrolyzed surface layer and waste-crack interactions. The samples were polished , then chemically etched in buffered HF solution to remove 45,90,135, and 180 nm of surface material. Another set of samples was cleaved and soaked in boiling distilled water for 1 second and 1 hour. All the samples were irradiated at damaging fluencies and characterized by Normarski optical microscopy and scanning electron microscopy. Damage was initiated as micro-pits on both input and output surfaces of the polished fused silica sample. At higher fluencies, the micro-pits generated cracks on the surface. Laser damage of the polished surface showed significant trace contamination levels within a 50 nm surface layer. Micro-pit formation also appeared after irradiating cleaved fused silica surfaces at damaging fluences. Linear damage tracks corresponding cleaving tracks were often observed on cleaved surfaces. Soaking cleaved samples in water produced wide laser damage tracks.},
doi = {},
url = {https://www.osti.gov/biblio/641346}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 23 00:00:00 EST 1997},
month = {Tue Dec 23 00:00:00 EST 1997}
}

Conference:
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