Finite element analysis of the distortion of a crystal monochromator from synchrotron radiation thermal loading

Conference · Tue Oct 01 00:00:00 EDT 1985

OSTI ID:6398997

Edwards, W R; Hoyer, E H; Thompson, A C

The first crystal of the Brown-Hower x-ray monochromator of the LBL-EXXON 54 pole wiggler beamline at Stanford Synchrotron Radiation Laboratory (SSRL) is subjected to intense synchrotron radiation. To provide an accurate thermal/structural analysis of the existing monochromator design, a finite element analysis (FEA) was performed. A very high and extremely localized heat flux is incident on the Si (220) crystal. The crystal, which possesses pronouncedly temperature-dependent orthotropic properties, in combination with the localized heat load, make the analysis ideally suited for finite element techniques. Characterization of the incident synchrotron radiation is discussed, followed by a review of the techniques employed in modeling the monochromator and its thermal/structural boundary conditions. The results of the finite element analysis, three-dimensional temperature distributions, surface displacements and slopes, and stresses, in the area of interest, are presented. Lastly, the effects these results have on monochromator output flux and resolution are examined.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6398997
• Report Number(s): LBL-20306; CONF-8510186-5; ON: DE86004000
• Resource Relation: Conference: International conference on insertion devices, Stanford, CA, USA, 28 Oct 1985; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
43 PARTICLE ACCELERATORS
SYNCHROTRON RADIATION SOURCES
MONOCHROMATORS
X-RAY SPECTROSCOPY
FINITE ELEMENT METHOD
RESOLUTION
SILICON
ELEMENTS
NUMERICAL SOLUTION
RADIATION SOURCES
SEMIMETALS
SPECTROSCOPY
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