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Title: Fundamental science of f-elements in selected immobilization glasses: Significance for TRU disposal schemes

Technical Report ·
DOI:https://doi.org/10.2172/634158· OSTI ID:634158
;  [1];  [2]
  1. Oak Ridge National Lab., TN (United States). Chemical and Analytical Sciences Div.
  2. Winston-Salem State Univ., NC (United States). Dept. of Physical Science

The authors have investigated certain aspects of the fundamental chemistry and materials science of the 4f- and 5f-elements in three glass matrices. Two of these matrices were high-temperature (850 and 1,450 C melting points) silicate-based glasses and the third was a sol-gel glass. Optical spectroscopy was the principle investigating tool. A primary aspect of this work was to ascertain the oxidation state exhibited by the elements in the different glasses, as well as the factors that control and/or may alter this state. An important finding has been that the authors have noted a general correlation between the oxidation states obtained in the two high-temperature glasses and their high-temperature oxide chemistries. Of the twenty three f-elements considered here, only a few exceptions (Am and Bk) or variations (Ce, Pr, Tb, U, Cf) to this correlation have been noted. Explanations are offered for these cases. The correlation also applied to the sol-gel glasses after heating to > 400 C, but other oxidation states of certain f-elements could be retained in the unheated glasses prepared by the sol-gel approach. Presented here is a summary of the oxidation states observed for these elements in the three glass matrices and how these states correlate with those observed in their high-temperature oxides.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-96OR22464
OSTI ID:
634158
Report Number(s):
CONF-970902-1; ON: DE97009384; TRN: 98:009485
Resource Relation:
Conference: 21. symposium on the scientific basis for nuclear waste management, Davos (Switzerland), 28 Sep - 3 Oct 1997; Other Information: PBD: Aug 1997
Country of Publication:
United States
Language:
English