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Title: Impurity-defect complexes in hydrogenated amorphous silicon

Conference ·
OSTI ID:6334634
 [1];  [2];  [3]
  1. Argonne National Lab., IL (USA)
  2. California Univ., Davis, CA (USA). Dept. of Physics
  3. Cornell Univ., Ithaca, NY (USA). Dept. of Materials Science and Engineering

The two most outstanding features observed for dopants in hydrogenated amorphous silicon (a-Si:H) -- a shift in the Fermi level accompanied by an increase in the defect density and an absence of degenerate doping -- have previously been postulated to stem from the formation of substitutional dopant-dangling bond complexes. Using first-principles self-consistent pseudopotential calculation in conjunction with a supercell model for the amorphous network and the ability of network relaxation from the first-principles results, we have studied the electronic and structural properties of substitutional fourfold-coordinated phosphorus and boron at the second neighbor position to a dangling bond defect. We demonstrate that such impurity-defect complexes can account for the general features observed experimentally in doped a-Si:H. 16 refs., 2 figs., 1 tab.

Research Organization:
Argonne National Lab., IL (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6334634
Report Number(s):
CONF-901105-82; ON: DE91006765
Resource Relation:
Conference: Fall meeting of the Materials Research Society, Boston, MA (USA), 24 Nov - 1 Dec 1990
Country of Publication:
United States
Language:
English