Radiative interactions with micromachined surfaces: Spectral polarized emittance

Conference · Tue Jan 01 00:00:00 EST 1991

OSTI ID:6257052

Zemel, J N

The spectral, angular, polarized emittance (SAPE) is a simple means for observing the allowed electromagnetic energy states associated with periodic structures whose dimensions are comparable to the wavelength of the observed light. Other methods for measuring absorption are far more time consuming when a broad survey is of interest. An extensive body of SAPE data was obtained on 350-- 400{degrees}C intrinsic silicon lamellar gratings. Current approximations to the vector wave equation such as guided wave, modal and Bloch wave methods provided insight into our experiments. A qualitative picture of the stationary electromagnetic states (SES) of lamellar gratings has been developed which agrees with experiment for a number of polarizations, and angular orientations of the emission k vector relative to the gratings. However, one type of emission does not fit any simple model we have examined and raises intriguing questions about emission from grating structures. A new, higher angular resolution emissometer (0.8{degrees} instead of 5{degrees}) has been completed. This system significantly increases the wavelength range from the current 3--14 {mu}m range to 2-25{mu}m, a doubling of the spectral regime. The system is currently in a shakedown'' mode. Preliminary data indicates that the new emissometer meets the design goals. 24 refs., 10 figs.

• Research Organization: Pennsylvania Univ., Philadelphia, PA (United States). Dept. of Electrical Engineering
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-88ER13964
• OSTI ID: 6257052
• Report Number(s): DOE/ER/13964-3; CONF-9105275-1; ON: DE92001742
• Resource Relation: Conference: Micro-macro studies of multiphase media, Argonne, IL (United States), 9-11 May 1991
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
36 MATERIALS SCIENCE
SILICON
EMISSIVITY
ANALYTICAL SOLUTION
DIFFRACTION GRATINGS
ELECTROMAGNETIC RADIATION
ELLIPSOMETERS
HIGH TEMPERATURE
MEASURING METHODS
POLARIZATION
PROGRESS REPORT
SURFACES
THERMAL RADIATION
DOCUMENT TYPES
ELEMENTS
GRATINGS
MEASURING INSTRUMENTS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
POLARIMETERS
RADIATIONS
SEMIMETALS
SURFACE PROPERTIES
664200* - Spectra of Atoms & Molecules & their Interactions with Photons- (1992-)
360606 - Other Materials- Physical Properties- (1992-)