Utility of replica techniques for x-ray microanalysis of second phase particles

Conference · Sun Jan 01 00:00:00 EST 1984

OSTI ID:6175370

Bentley, J

X-ray microanalysis of second phase particles in ion-milled or electropolished thin foils is often complicated by the presence of the matrix nearby. Extraction replica techniques provide a means to avoid many of the complications of thin-foil analyses. In this paper, three examples of the analysis of second phase particles are described and illustrate the improvement obtained by the use of extraction replicas for qualitative analysis, quantitative analysis, and analysis of radioactive specimens.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6175370
• Report Number(s): CONF-840767-13; ON: DE85005564
• Resource Relation: Conference: Microbeam Analysis Society analytical electron microscopy meeting, Bethlehem, PA, USA, 16 Jul 1984
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALUMINIUM
PHYSICAL RADIATION EFFECTS
MICROANALYSIS
REPLICA TECHNIQUES
MOLYBDENUM
ION IMPLANTATION
STAINLESS STEEL-321
ALUMINIUM IONS
NEUTRON BEAMS
X RADIATION
ALLOYS
BEAMS
CHARGED PARTICLES
CHROMIUM ALLOYS
CHROMIUM STEELS
CHROMIUM-NICKEL STEELS
CORROSION RESISTANT ALLOYS
ELECTROMAGNETIC RADIATION
ELEMENTS
HEAT RESISTANT MATERIALS
HEAT RESISTING ALLOYS
IONIZING RADIATIONS
IONS
IRON ALLOYS
IRON BASE ALLOYS
MATERIALS
METALS
NICKEL ALLOYS
NUCLEON BEAMS
PARTICLE BEAMS
RADIATION EFFECTS
RADIATIONS
STAINLESS STEELS
STEELS
TITANIUM ADDITIONS
TITANIUM ALLOYS
TRANSITION ELEMENTS
400103* - Radiometric & Radiochemical Procedures- (-1987)