The Use of X-Ray Microbeams in Materials Science
Most materials are heterogeneous on mesoscopic length scales (tenths-to-tens of microns), and materials properties depend critically on mesoscopic structures such as grain sizes, texture, and impurities. The recent availability of intense, focused x-ray microbeams at synchrotron facilities has enabled new techniques for mesoscale materials characterization. We describe instrumentation and experiments on the MHATT-CAT and UNICAT undulator beamlines at the Advanced Photon Source which use micron and submicron-size x-ray beams to investigate the grain orientation, local strain and defect content in a variety of materials of technological interest. Results from a combinatorial study on epitaxial growth of oxide films on textured metal substrates will be described to illustrate x-ray microbeam capabilities.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Oak Ridge, TN
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 6151
- Report Number(s):
- ORNL/CP-102319; KC 02 02 04 0; ON: DE00006151
- Resource Relation:
- Conference: 9th User's Meeting for the Advanced Photon Source, Argonne, IL, Oct. 13-15, 1998
- Country of Publication:
- United States
- Language:
- English
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