X-ray microscopy using synchrotron radiation

Conference · Sun Jan 01 00:00:00 EST 1989

OSTI ID:6082476

Jones, K W; Gordon, B M; Hanson, A L; Pounds, J G; Rivers, M L; Schidlovsky, G; Smith, J V; Spanne, P; Sutton, S R

The system for x-ray microscopy now being developed at the X-26 beam line of the Brookhaven National Synchrotron Light Source (NSLS) is described here. Examples of the use of x-ray microscopy for trace element geochemistry, biology and medicine, and materials investigations are given to emphasize the scientific applications of the technique. Future directions for the improvement and further development of the X-26 microscope and of the x-ray microscopy field in general are discussed. 11 refs., 7 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6082476
• Report Number(s): BNL-42582; CONF-890748-8; ON: DE89010569; TRN: 89-016794
• Resource Relation: Conference: Microbeam Analysis Society meeting, Asheville, NC, USA, 16 Jul 1989; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

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