Development of integrated thermionic circuits for high-temperature applications

Conference · Thu Jan 01 00:00:00 EST 1981

OSTI ID:5899570

McCormick, J B; Wilde, D; Depp, S; Hamilton, D J; Kerwin, W

This report describes a class of microminiature, thin film devices known as integrated thermionic circuits (ITC) capable of extended operation in ambient temperatures up to 500/sup 0/C. The evolution of the ITC concept is discussed. A set of practical design and performance equations is demonstrated. Recent experimental results are discussed in which both devices and simple circuits have successfully operated in 500/sup 0/C environments for extended periods of time (greater than 11,000 hours).

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); IBM Research Div., San Jose, CA (USA); Univ. of Arizona, Tucson, AZ (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 5899570
• Report Number(s): LA-UR-81-3300; CONF-811213-3; ON: DE82004339
• Resource Relation: Conference: IEEE high temperature electronics and instrumentation conference, Houston, TX, USA, 7 Dec 1981
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
INTEGRATED CIRCUITS
THERMIONICS
DESIGN
FABRICATION
HIGH TEMPERATURE
MICROELECTRONIC CIRCUITS
MINIATURIZATION
OPERATION
PERFORMANCE
ELECTRONIC CIRCUITS
420800* - Engineering- Electronic Circuits & Devices- (-1989)