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Title: Sub-100 ps bulk-recombination-limited InP:Fe photoconductive detector

Conference ·

Both surface and bulk excited semi-insulating InP optoelectronic switches were studied. It was found that transient recombination in these devices is the same for both types of excitation. It is concluded that the recombination is a bulk controlled process.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
5877662
Report Number(s):
LA-UR-81-2882; CONF-811207-2; ON: DE82002395
Resource Relation:
Conference: International electron devices meeting, Washington, DC, USA, 7 Dec 1981
Country of Publication:
United States
Language:
English