Angle-resolved photoemission extended fine structure

Technical Report · Fri Mar 01 00:00:00 EST 1985

DOI:https://doi.org/10.2172/5860703· OSTI ID:5860703

Barton, J J

Measurements of the Angle-Resolved Photoemission Extended Fine Structure (ARPEFS) from the S(1s) core level of a c(2 x 2)S/Ni(001) are analyzed to determine the spacing between the S overlayer and the first and second Ni layers. ARPEFS is a type of photoelectron diffraction measurement in which the photoelectron kinetic energy is swept typically from 100 to 600 eV. By using this wide range of intermediate energies we add high precision and theoretical simplification to the advantages of the photoelectron diffraction technique for determining surface structures. We report developments in the theory of photoelectron scattering in the intermediate energy range, measurement of the experimental photoemission spectra, their reduction to ARPEFS, and the surface structure determination from the ARPEFS by combined Fourier and multiple-scattering analyses. 202 refs., 67 figs., 2 tabs.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5860703
• Report Number(s): LBL-19215; ON: DE85010980
• Resource Relation: Other Information: Thesis
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
NICKEL
ELECTRON COLLISIONS
FINE STRUCTURE
PHOTOELECTRIC EMISSION
ANGULAR DISTRIBUTION
ELECTRON DIFFRACTION
EXPERIMENTAL DATA
FOURIER TRANSFORMATION
MULTIPLE SCATTERING
RAMSAUER EFFECT
WAVE FUNCTIONS
COHERENT SCATTERING
COLLISIONS
DATA
DIFFRACTION
DISTRIBUTION
ELECTRON EMISSION
ELEMENTS
EMISSION
FUNCTIONS
INFORMATION
INTEGRAL TRANSFORMATIONS
METALS
NUMERICAL DATA
SCATTERING
TRANSFORMATIONS
TRANSITION ELEMENTS
640301* - Atomic
Molecular & Chemical Physics- Beams & their Reactions