Design of doubly focusing, tunable (5 to 30 keV), wide-bandpass optics made from layered synthetic microstructures

Conference · Fri Jan 01 00:00:00 EST 1982

OSTI ID:5839330

Bilderback, D H; Lairson, B M; Barbee, Jr, T W; Ice, G E; Sparks, Jr, C J

Layered Synthetic Microstructures (LSMs) show great promise as focusing, high-throughput, hard x-ray monochromators. Experimental reflectivity vs. energy curves have been obtained on carbon-tungsten and carbon-molybdenum LSMs of up to 260 layers in thickness. Reflectivities for three flat LSMs with different bandpasses were 70% with ..delta..E/E = 5.4%, 66% with ..delta..E/E = 1.4%, and 19% with ..delta..E/E = 0.6%. A new generation of variable bandwidth optics using two successive LSMs is proposed. The first element will be an LSM deposited on a substrate that can be water cooled as it intercepts direct radiation from a storage ring. It can be bent for vertical focusing. The bandpass can be adjusted by choosing interchangeable first elements from an assortment of LSM's with different bandpasses (for example, ..delta..E/E = 0.005, 0.01, 0.02, 0.05, 0.1). The second LSM will consist of a multilayered structure with a 10% bandpass built onto a flexible substrate that can be bent for sagittal focusing. The result will be double focusing optics with an adjustable energy bandpass that are tunable from 5 to 30 keV.

• Research Organization: Cornell Univ., Ithaca, NY (USA); Stanford Univ., CA (USA). Dept. of Materials Science; Oak Ridge National Lab., TN (USA)
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 5839330
• Report Number(s): CONF-820839-9; ON: DE83015492
• Resource Relation: Conference: International conference on X-ray and VUV synchrotron radiation instrumentation, Hamburg, F.R. Germany, 9 Aug 1982
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
MONOCHROMATORS
DESIGN
REFLECTIVITY
CARBON
FOCUSING
HARD X RADIATION
HARMONICS
MICROSTRUCTURE
MOLYBDENUM
TUNGSTEN
TUNING
CRYSTAL STRUCTURE
ELECTROMAGNETIC RADIATION
ELEMENTS
IONIZING RADIATIONS
METALS
NONMETALS
OPTICAL PROPERTIES
OSCILLATIONS
PHYSICAL PROPERTIES
RADIATIONS
SURFACE PROPERTIES
TRANSITION ELEMENTS
X RADIATION
440300* - Miscellaneous Instruments- (-1989)