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Title: Stability of multilayers for short-wavelength optics

Conference ·
OSTI ID:5756720

A variety of multilayer mirrors with transition metal absorber layers (W-C, Wre-C, Co-C, and Cr-C) have been fabricated and tested up to 1000 C using standard 0.20 x-ray diffraction, Debye-Scherrer scattering and microcleavage transmission electron microscopy. The 0-20 x-ray diffraction during annealing shows the Bragg peak position to shift toward lower angles with increasing temperature. This irreversible shift starts at around 300 C and is equivalent to as much as 12% expansion of the multilayer period with a temperature change from ambient to 750 C. In all cases a crystallization occurs in the metal component between 650-750 C. The different types of crystalline compounds formed have been identified by the Debye-Scherrer technique. As a consequence of this crystallization abrupt changes occur in the multilayer structure. Electron microscopy shows that the surface roughness increases by formation of hillocks and the layered structure is destroyed. Moreover the x-ray reflectivity decreases considerably. The expansion and crystallization are of great importance in cases where a precise multilayer period is required or in devices intended for high x-ray flux applications.

Research Organization:
Argonne National Lab., IL (USA); International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
5756720
Report Number(s):
CONF-860316-9; ON: DE86012129; TRN: 86-020647
Resource Relation:
Conference: Topical meeting on short wave length coherent radiation, Monterey, CA, USA, 24 Mar 1986; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English