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Title: Techniques of absolute low energy x-ray calibration

Conference ·
DOI:https://doi.org/10.1117/12.936570· OSTI ID:5728957

Recent advances in pulsed plasma research, materials science, and astrophysics have required many new diagnostic instruments for use in the low energy x-ray regime. The characterization of these instruments has provided a challenge to instrument designers and provided the momentum to improve x-ray sources and dosimetry techniques. In this paper, the present state-of-the-art in low energy x-ray characterization techniques is reviewed. A summary is given of low energy x-ray generator technology and dosimetry techniques including a discussion of thin window proportional counters and ionization chambers. A review is included of the widely used x-ray data bases and a sample of ultrasoft x-ray measuring procedures, chopped x-ray source generators, phase sensitive detection of ultralow currents, and angular divergence measurements.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
5728957
Report Number(s):
LA-UR-86-2255; CONF-860880-6; ON: DE86012426
Resource Relation:
Journal Volume: 0689; Conference: 30. SPIE technical symposium on optics and optoelectronic engineering, San Diego, CA, USA, 17 Aug 1986
Country of Publication:
United States
Language:
English