Direct structure determination by atomic-resolution incoherent STEM imaging
Conference
·
OSTI ID:564249
- Univ. of Cambridge (United Kingdom). Cavendish Lab.
- Oak Ridge National Lab., TN (United States). Solid State Div.
Use of a large, annular dark-field (ADF) detector in a scanning transmission electron microscope is shown to give images that can allow direct structure determination, being a convolution between the illuminating probe intensity and an object function localized at the atomic column positions. The ADF image is also shown to resolve crystal spacings more than twice smaller than the phase contrast point resolution limit of the microscope used, with sub-angstrom structural information being retrieved. ADF image of several semiconductor materials are studied.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 564249
- Report Number(s):
- ORNL/CP-95489; CONF-970911-; ON: DE98001838; BR: KC0202040; TRN: AHC29804%%130
- Resource Relation:
- Conference: Biennal conference of the Electron Microscopy and Analysis Group of the Institute of Physics, Cambridge (United Kingdom), 2-5 Sep 1997; Other Information: PBD: Nov 1997
- Country of Publication:
- United States
- Language:
- English
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