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Title: High resolution monochromator for inelastic scattering studies of high energy phonons using undulator radiation at the advanced photon source

Conference ·
OSTI ID:561144

A monochromator for use at 13.84 keV with a calculated bandpass of 5.2 meV was designed built, and tested. Tuning was performed by rotating the inner crystal of a pair of nested silicon channel-cut crystals. The inner crystal employs the (884) reflection, and the outer crystal employs a collimating asymmetric (422) reflection (dynamical asymmetry factor, b, equal to {minus}17.5). Tests were done with a double-crystal Si(111) pre-monochromator situated upstream of the high resolution monochromator and a Si(777) backscattering crystal situated downstream. For this optical arrangement an ideal value of 6.3 meV as calculated by x-ray dynamical diffraction theory applies for the FWHM of the convolution of the net monochromator reflectivity function with that of the Si(777) reflection. This calculated value is to be compared to the value of 7.1 meV measured by tuning the high resolution monochromator. Measured efficiencies were less than ideal by a factor of 3.2 to 4.9, where the larger flux reduction factors were found with higher positron storage ring currents.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
561144
Report Number(s):
ANL/XFD/CP-92042; CONF-970706-; ON: DE97054142; TRN: 98:000205
Resource Relation:
Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997; Other Information: PBD: Aug 1997
Country of Publication:
United States
Language:
English