Analytical transmission electron microscopy in materials science

Conference · Tue Jan 01 00:00:00 EST 1980

OSTI ID:5596134

Fraser, H L

Microcharacterization of materials on a scale of less than 10 nm has been afforded by recent advances in analytical transmission electron microscopy. The factors limiting accurate analysis at the limit of spatial resolution for the case of a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy are examined in this paper.

• Research Organization: United Technologies Research Center, East Hartford, CT (USA)
• DOE Contract Number: EY-76-C-02-1198
• OSTI ID: 5596134
• Report Number(s): COO-1198-1284; CONF-800510-1
• Resource Relation: Conference: International conference on pure materials in technology, Dresden, German Democratic Republic, May 1980
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MATERIALS
MICROANALYSIS
TRANSMISSION ELECTRON MICROSCOPY
OPERATION
BACKGROUND NOISE
ELECTRONS
PROBES
SURFACE PROPERTIES
ELECTRON MICROSCOPY
ELEMENTARY PARTICLES
FERMIONS
LEPTONS
MICROSCOPY
NOISE
440103* - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation