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Title: Investigation of reliability attributes and accelerated stress factors of terrestrial solar cells. Second annual report

Technical Report ·
DOI:https://doi.org/10.2172/5595307· OSTI ID:5595307

The work covered in this report represents the second year's effort of a continuing program to determine the reliability attributes of terrestrial solar cells. Three main tasks were undertaken during the reporting period: (1) a study of the electrical behavior of cells in the second (reverse) quadrant, (2) the accelerated stress testing of three new state of the art cells and (3) the continued bias-temperature testing of four Block II type silicon cells at 78/sup 0/C and 135/sup 0/C. Electrical characteristics measured in the second quadrant were determined to be a function of the cell's thermal behavior with breakdown depending on the initiation of localized heating. This implied that high breakdown cells may be more fault tolerant when forced to operate in the second quadrant - a result contrary to conventional thinking. The accelerated stress tests used in the first (power) quadrant were bias-temperature, bias-temperature-humidity, temperature-humidity, thermal shock, and thermal cycle. The new type cells measured included an EFG cell, a polycrystalline cell, and a Czochralski cell. Electrical parameters measured included I/sub SC/, V/sub OC/, P/sub M/, and I/sub M/. Incorporated in the report are the distributions of prestress electrical data for all cell types. Significant differences in the response to the various stress tests were observed between cell types. A microprocessed controlled, short interval solar cell tester was designed and construction initiated on a prototype for use in the program.

Research Organization:
Clemson Univ., SC (USA)
DOE Contract Number:
NAS-7-100-954929
OSTI ID:
5595307
Report Number(s):
DOE/JPL/954929-80/7
Country of Publication:
United States
Language:
English