Transient x-ray diffraction and its application to materials science and x-ray optics

Conference · Mon Dec 01 00:00:00 EST 1997

OSTI ID:555283

Hauer, A A; Kopp, R; Cobble, J; Kyrala, G; Springer, R ^[1]

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1. and others

Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasmas as the x-ray source for transient diffraction.

• Research Organization: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 555283
• Report Number(s): LA-UR-97-3585; CONF-970706-; ON: DE98001460; TRN: 98:000157
• Resource Relation: Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997; Other Information: PBD: 1997
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ELECTRON BEAMS
OPTICS
X-RAY DIFFRACTION
X-RAY SOURCES
SHOCK WAVES