First measurements using the ALS Soft X-ray Fourier Transform spectrometer

Conference · Fri Aug 01 00:00:00 EDT 1997

OSTI ID:554166

Moler, E J; Duarte, R M; Howells, M R; Hussain, Z; Spring, J ^[1]

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1. and others

Commissioning of a Fourier Transform Soft X-ray spectrometer (FT-SX) is under way at the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory, as a branch of beamline 9.3.2. The spectrometer is a novel soft x-ray interferometer designed for ultra-high resolution spectroscopy in the photon experimental results which sensitively test models of correlated electron processes in atomic and molecular physics. The design criteria and consequent technical challenges posed by the short wavelengths of x-rays and desired resolving power are discussed. The fundamental and practical aspects of soft x-ray interferometry are also explored.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Office of Energy Research, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 554166
• Report Number(s): LBNL-40738; CONF-970706-; LSBL-406; ON: DE98050027; TRN: 98:002490
• Resource Relation: Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997; Other Information: PBD: Aug 1997
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADVANCED LIGHT SOURCE
FOURIER TRANSFORM SPECTROMETERS
INTERFEROMETRY
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
ALIGNMENT
BEAM OPTICS