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Title: Aging of electronics with application to nuclear power plant instrumentation. [PWR; BWR]

Conference ·
OSTI ID:5539828

A survey to identify areas of needed research to understand aging mechanisms for electronics in nuclear power plant instrumentation has been completed. The emphasis was on electronic components such as semiconductors, capacitors, and resistors used in safety-related instrumentation in the reactor containment area. The environmental and operational stress factors which may produce degradation during long-term operation were identified. Some attention was also given to humidity effects as related to seals and encapsulants, and failures in printed circuit boards and bonds and solder joints. Results suggest that neutron as well as gamma irradiations should be considered in simulating the aging environment for electronic components. Radiation dose-rate effects in semiconductor devices and organic capacitors need to be further investigated, as well as radiation-voltage bias synergistic effects in semiconductor devices and leakage and permeation of moisture through seals in electronics packages.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
USNRC; USDOE
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5539828
Report Number(s):
SAND-83-0658C; CONF-831015-3; ON: DE84000465
Resource Relation:
Conference: Nuclear science symposium, San Francisco, CA, USA, 19 Oct 1983
Country of Publication:
United States
Language:
English