Gyro-electron ghost images due to microchannel plate operation in transverse magnetic fields
A multi-anode microchannel plate (MCP) detector was operated in a transverse magnetic field. When a collimated ion beam of approx.4-mm diameter impinged on one area of the plate, ghost images were observed elsewhere on the plate at anodes up to several centimeters from the beam spot. This effect is due to secondary electrons which are emitted from the interstitial surfaces around the MCP pores and returned to the surface of the plate under the influence of E-tilde X B-tilde fields, where E-tilde is the electric field perpendicular to the plate due to the MCP bias potential and B-tilde is the externally applied transverse magnetic field. A regenerative process is observed in which the secondary electrons traverse the surface of the plate in the E-tilde X B-tilde direction by successive gyro-orbit steps. A method for suppressing the ghost images is discussed.
- Research Organization:
- Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
- DOE Contract Number:
- AC02-76CH03073
- OSTI ID:
- 5517931
- Report Number(s):
- PPPL-2332; ON: DE86013618
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products. Original copy available until stock is exhausted
- Country of Publication:
- United States
- Language:
- English
Similar Records
Applications of the Microchannel Plate for Mass Spectrometry
Microchannel plate electron multiplier for mass spectrometer applications