Surface extended x-ray absorption fine structure of low-Z absorbates using fluorescence detection

Technical Report · Wed May 01 00:00:00 EDT 1985

DOI:https://doi.org/10.2172/5380906· OSTI ID:5380906

Stoehr, J; Kollin, E B; Fischer, D A; Hastings, J B; Zaera, F; Sette, F

Comparison of x-ray fluorescence yield (FY) and electron yield surface extended x-ray absorption fine structure spectra above the S K-edge for c(2 x 2) S on Ni(100) reveals an order of magnitude higher sensitivity of the FY technique. Using FY detection, thiophene (C/sub 4/H/sub 4/S) chemisorption on Ni(100) is studied with S coverages down to 0.08 monolayer. The molecule dissociates at temperatures as low as 100K by interaction with fourfold hollow Ni sites. Blocking of these sites by oxygen leaves the molecule intact.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5380906
• Report Number(s): BNL-36607; ON: DE85016061
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
NICKEL
SORPTIVE PROPERTIES
THIOPHENE
CHEMISORPTION
DISSOCIATION
AUGER ELECTRON SPECTROSCOPY
OXYGEN
SULFUR
X-RAY FLUORESCENCE ANALYSIS
CHEMICAL ANALYSIS
CHEMICAL REACTIONS
ELECTRON SPECTROSCOPY
ELEMENTS
HETEROCYCLIC COMPOUNDS
METALS
NONDESTRUCTIVE ANALYSIS
NONMETALS
ORGANIC COMPOUNDS
ORGANIC SULFUR COMPOUNDS
SEPARATION PROCESSES
SORPTION
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
360104* - Metals & Alloys- Physical Properties
400301 - Organic Chemistry- Chemical & Physicochemical Properties- (-1987)