Life testing of conductively coupled thermoelectric cells. Final report for task 11
Four conductively coupled thermoelectric cells, developed under the SP100 program, have been life tested. These cells, referred to as TOC (Task Order Contract) cells, were fourth generation cells, and incorporated design improvements to extend operating life. GS526 glass had been added to suppress the loss of Ge from the MoGe bond between the SiGe and the barrier graphite. The previous generation was life limited by the degradation of this electrical bond at the SiGe to graphite hot side interface due to the Ge loss. This led to abnormal internal resistance trends. The TOC cell test data and post test diagnostic have confirmed the effectiveness of the perimeter glass. Three of the four cells demonstrated normal electrical performance trends. The fourth cell (No. 139) tested at JPL showed an abnormal increase in internal resistance and a shift in temperature levels at 12,400 hours following a facility shutdown and restart. When the cell was removed from the test fixture, separation occurred between the hot side compliant pad facesheet and the niobium filament bundles. No degradation of the bond between the SiGe and the barrier graphite was found and the change in slope of the internal resistance was attributed to changes in the rate of dopant precipitation caused by the shift in temperature levels.
- Research Organization:
- General Electric Co., Philadelphia, PA (United States)
- Sponsoring Organization:
- USDOE Assistant Secretary for Nuclear Energy, Washington, DC (United States)
- DOE Contract Number:
- AC03-89SF17787
- OSTI ID:
- 534543
- Report Number(s):
- DOE/SF/17787-T21; ON: DE98000305; TRN: 97:005425
- Resource Relation:
- Other Information: PBD: 26 Sep 1997
- Country of Publication:
- United States
- Language:
- English
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