Inorganic chemically active adsorbents (ICAAs)
- Oak Ridge National Lab., TN (United States)
Oak Ridge National Laboratory (ORNL) researchers are developing a technology that combines metal chelation extraction technology and synthesis chemistry. They begin with a ceramic substrate such as alumina, titanium oxide or silica gel because they provide high surface area, high mechanical strength, and radiolytic stability. One preparation method involves silylation to hydrophobize the surface, followed by chemisorption of a suitable chelation agent using vapor deposition. Another route attaches newly designed chelating agents through covalent bonding by the use of coupling agents. These approaches provide stable and selective, inorganic chemically active adsorbents (ICAAs) tailored for removal of metals. The technology has the following advantages over ion exchange: (1) higher mechanical strength, (2) higher resistance to radiation fields, (3) higher selectivity for the desired metal ion, (4) no cation exchange, (5) reduced or no interference from accompanying anions, (6) faster kinetics, and (7) easy and selective regeneration. Target waste streams include metal-containing groundwater/process wastewater at ORNL`s Y-12 Plant (multiple metals), Savannah River Site (SRS), Rocky Flats (multiple metals), and Hanford; aqueous mixed wastes at Idaho National Engineering Laboratory (INEL); and scrubber water generated at SRS and INEL. Focus Areas that will benefit from this research include Mixed Waste, and Subsurface Contaminants.
- Research Organization:
- Science, Inc., Anaheim, CA (United States)
- OSTI ID:
- 527209
- Report Number(s):
- PNNL-SA-28461-Rev.1; CONF-970148-Rev.1; ON: DE97052111; TRN: 97:015052
- Resource Relation:
- Conference: Efficient Separations and Processing (ESP) Crosscutting Program FY 1997 technical exchange meeting, Gaithersburg, MD (United States), 28-30 Jan 1997; Other Information: PBD: [1997]; Related Information: Is Part Of Proceedings of the efficient separations and processing crosscutting program 1997 technical exchange meeting; Gephart, J.M. [ed.]; PB: 211 p.
- Country of Publication:
- United States
- Language:
- English
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