X-ray spectra from the Cornell Electron-Beam Ion Source (CEBIS I)

Conference · Tue Jan 01 00:00:00 EST 1985

OSTI ID:5174187

Johnson, B M; Jones, K W; Kostroun, V O; Ghanbari, E; Janson, S W

Radiation emitted from the Cornell electron beam ion source (CEBIS I) has been surveyed with a Si(Li) x-ray detector. These spectra can be used to estimate backgrounds from electron bremsstrahlung and to evaluate the feasibility of atomic physics experiments using the CEBIS I source in this configuration. 1 ref., 2 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (USA); Cornell Univ., Ithaca, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5174187
• Report Number(s): BNL-36927; CONF-8505203-1; ON: DE85018484
• Resource Relation: Conference: 3. workshop on electron beam ion sources and their applications, Ithaca, NY, USA, 20 May 1985; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRON BEAM ION SOURCES
X RADIATION
RADIATION DOSES
X-RAY SOURCES
DOSES
ELECTROMAGNETIC RADIATION
EQUIPMENT
ION SOURCES
IONIZING RADIATIONS
RADIATION SOURCES
RADIATIONS
X-RAY EQUIPMENT
640301* - Atomic
Molecular & Chemical Physics- Beams & their Reactions