Mechanism for diffusion induced grain boundary migration

Technical Report · Fri Aug 01 00:00:00 EDT 1980

DOI:https://doi.org/10.2172/5013063· OSTI ID:5013063

Balluffi, R W; Cahn, J W

Grain boundaries are found to migrate under certain conditions when solute atoms are diffused along them. This phenomenon, termed diffusion induced grain boundary migration (DIGM), has now been found in six systems. The observed phenomenon and empirical data are used to discard certain concepts for the driving force and the mechanism. A mechanism is proposed in which differences in the diffusion coefficients of the diffusing species along the grain boundary cause a self-sustaining climb of grain boundary dislocations and motion of their associated grain boundary steps.

• Research Organization: Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); National Bureau of Standards, Washington, DC (USA). Center for Materials Science
• DOE Contract Number: AS02-78ER05002
• OSTI ID: 5013063
• Report Number(s): DOE/ER/05002-13
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
METALS
GRAIN BOUNDARIES
CRYSTAL STRUCTURE
ELEMENTS
MICROSTRUCTURE
360102* - Metals & Alloys- Structure & Phase Studies