Revised model of thermally stimulated current in MOS capacitors
Conference
·
OSTI ID:484580
It is shown analytically and experimentally that thermally stimulated current (TSC) measurements at negative bias incompletely describe oxide-trap charge in SIMOX and bipolar base oxides irradiated at 0 V. Positive-bias TSC is also required.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States); USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 484580
- Report Number(s):
- SAND-97-1332C; CONF-970711-9; ON: DE97006359; TRN: 97:003820
- Resource Relation:
- Conference: 34. IEEE nuclear and space radiation effects conference, Snowmass, CO (United States), 21-25 Jul 1997; Other Information: PBD: 1997
- Country of Publication:
- United States
- Language:
- English
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