Strain-optic voltage monitor
Patent Application
·
OSTI ID:463633
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- US Dept. of Energy, Washington, DC (United States)
- Patent Number(s):
- PATENTS-US-A8407148
- Application Number:
- ON: DE97003867; PAN: 8-407,148; TRN: AHC29709%%70
- OSTI ID:
- 463633
- Resource Relation:
- Other Information: PBD: 1995
- Country of Publication:
- United States
- Language:
- English
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