Early stages in the high temperature cyclic oxidation of {beta}-NiAl: An x-ray reflectivity study
- and others
Early stages in the cyclic oxidation of {beta}-NiAl at 500{degrees}C, 600{degrees}C, 700{degrees}C and 800{degrees}C were investigated using the technique of x-ray reflectivity. By fitting the data to a model function, oxide layer thickness, roughness of the oxide-vapor interface, and the roughness of the oxide-substrate interface were obtained as a function of oxidation time and temperature of oxidation. The time dependence of the oxide thickness was observed to be logarithmic at lower temperatures (500{degrees}C and 600{degrees}C) while a conventional t{sup 0.5} kinetics was observed at the higher temperatures. Comparison of the roughness of the oxide-substrate interface with that of the oxide-vapor interface shows that for comparable oxide thicknesses and identical substrate conditions, the oxide-vapor interface was rougher than the oxide-substrate interface at all temperatures. This is consistent with the previously postulated growth mechanism (outward diffusion of cations) for oxide growth during the early stages of oxidation at these temperatures. Thus, x-ray reflectivity offers a convenient way of determining the oxide growth rates, and the roughness of the interfaces when the oxide layer is thin; this regime cannot be easily studied with the techniques that are currently used for oxidation studies.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 434450
- Report Number(s):
- ANL/MSD/CP-91227; CONF-961040-17; ON: DE97000970; TRN: 97:001118
- Resource Relation:
- Conference: 190. meeting of the Electrochemical Society and technical exhibition, San Antonio, TX (United States), 6-11 Oct 1996; Other Information: PBD: 1996
- Country of Publication:
- United States
- Language:
- English
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