SIMS analysis: Development and evaluation 1995 summary report
Secondary ion mass spectrometry (SIMS) was evaluated for characterizing Hg salts. It was found that sulfate and chloride species could be identified directly without sample preparation. Mercuric oxide could be identified by complexation with formic acid. Hg nitrates could be identified by complexation with cyclohexylamine (CHA). Laser desorption ion trap MS was evaluated for characterizing EDTA on environmental samples. No intact EDTA ions were observed, but a series of EDTA fragment ions were visible, particularly on basalt and soil. An ion trap SIMS was developed: a perrhenate ion gun was interfaced to a Teledyne ion trap spectrometer, and the entire device was mounted on a cart. The technology was demonstrated using a prototype ion trap SIMS instrument for detecting Hg{center_dot}CHA complexes formed from nitrate salts. Intensity of the ion gun was improved, and the surface damage of the particle was small, and ion gun technology transfer to Phi-Evans, Inc. is being considered. Two technology end users are at INEL`s Central Facilities Area 674 pond and acid pit of the Radioactive Waste Management Complex; target problem at both sites is the need for Hg speciation on soil samples.
- Research Organization:
- Lockheed Martin Idaho Technologies Co., Idaho Falls, ID (United States)
- Sponsoring Organization:
- USDOE Office of Environmental Restoration and Waste Management, Washington, DC (United States)
- DOE Contract Number:
- AC07-94ID13223
- OSTI ID:
- 421932
- Report Number(s):
- INEL-95/0526; ON: DE97050827; TRN: 97:002349
- Resource Relation:
- Other Information: PBD: Oct 1995
- Country of Publication:
- United States
- Language:
- English
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