Soft x-ray spectromicroscopy development for materials science at the Advanced Light Source
- Lawrence Berkeley National Lab., CA (United States)
- North Carolina State Univ., Raleigh, NC (United States)
- McMaster Univ., Hamilton, Ontario (Canada)
- Dow Texas Polymer Center, Freeport, TX (United States)
- Univ. of Wisconsin, Milwaukee, WI (United States)
Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 414417
- Report Number(s):
- LBNL-38906; CONF-960824-1; ON: DE97001260; TRN: 97:001834
- Resource Relation:
- Conference: 1. international synchrotron radiation satellite meeting, Argonne, IL (United States), 4-7 Aug 1996; Other Information: PBD: Aug 1996
- Country of Publication:
- United States
- Language:
- English
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