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Title: Soft x-ray spectromicroscopy development for materials science at the Advanced Light Source

Conference ·
OSTI ID:414417
;  [1];  [2];  [3];  [4];  [5]
  1. Lawrence Berkeley National Lab., CA (United States)
  2. North Carolina State Univ., Raleigh, NC (United States)
  3. McMaster Univ., Hamilton, Ontario (Canada)
  4. Dow Texas Polymer Center, Freeport, TX (United States)
  5. Univ. of Wisconsin, Milwaukee, WI (United States)

Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
414417
Report Number(s):
LBNL-38906; CONF-960824-1; ON: DE97001260; TRN: 97:001834
Resource Relation:
Conference: 1. international synchrotron radiation satellite meeting, Argonne, IL (United States), 4-7 Aug 1996; Other Information: PBD: Aug 1996
Country of Publication:
United States
Language:
English