A comparison of different texture analysis techniques

Conference · Thu Aug 01 00:00:00 EDT 1996

OSTI ID:379104

Wright, S I ^[1]; Kocks, U F ^[2]

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1. TexSEM Labs., Provo, UT (United States)
2. Los Alamos National Lab., NM (United States)

With the advent of automated techniques for measuring individual crystallographic orientations using electron diffraction, there has been an increase in the use of local orientation measurements for measuring textures in polycrystalline materials. Several studies have focused on the number of single orientation measurements necessary to achieve the statistics of more conventional texture measurement, techniques such as pole figure measurement using x-ray and neutron diffraction. This investigation considers this question but also is extended to consider the nature of the differences between textures measured using individual orientation measurements and those measured using x-ray diffraction.

• Research Organization: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 379104
• Report Number(s): LA-UR-96-1893; CONF-9609220-1; ON: DE96012160; TRN: 96:005547
• Resource Relation: Conference: 11. textures of materials conference, Xian (China), 16-20 Sep 1996; Other Information: PBD: 1996
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
COPPER
TEXTURE
POLYCRYSTALS
ELECTRON DIFFRACTION
NEUTRON DIFFRACTION
X-RAY DIFFRACTION
GRAIN SIZE
GRAIN ORIENTATION