Correlation between excitation of Alfven modes and degradation of ICRF heating efficiency in TFTR
- and others
Alfven modes are excited by energetic ions in TFTR during intense minority ICRF heating. There is a clear threshold in rf power above which the modes are destabilized. The net effect of these modes is the increase of the fast ion losses, with an associated saturation of the ion tail energy and of the efficiency of the heating. Typically, several modes are excited with progressive n-numbers, with frequencies in the neighborhood of 200 kHz. Results suggest that Energetic Particle Modes (EPM), mostly unseen by the Mirnov coils, are generated near the center and are responsible for the ion losses. Stronger global TAE modes, which are destabilized by the stream of displaced fast ions, appear responsible only for minor losses.
- Research Organization:
- Princeton Univ., Princeton Plasma Physics Lab., NJ (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC02-76CH03073
- OSTI ID:
- 304148
- Report Number(s):
- PPPL-3248; ON: DE97053287; TRN: 99:002028
- Resource Relation:
- Other Information: PBD: May 1997
- Country of Publication:
- United States
- Language:
- English
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