A simulation of recrystallization based on EBSD orientation microscopy data
The present paper introduces a novel stochastic two-dimensional model to simulate the evolution of microstructure and texture during recrystallization. The model is based on data derived by automated large-scale EBSD local texture analysis, i.e., by orientation microscopy. Each measured point is characterized by its coordinates x and y in the microstructure, its crystallographic orientation g and a parameter q describing the quality of the EBSD-pattern which is affected by lattice strain and hence discloses information on the dislocation density. The concurrent information on the local arrangement of orientations and dislocation densities is utilized to derive conclusions on the nucleation and subsequent growth of the new recrystallized grains. The principles of the model are outlined and three example are shown to illustrate the possibilities of the model to simulate the evolution of microstructure and texture during recrystallization.
- Research Organization:
- Los Alamos National Lab., Center for Materials Science, NM (United States)
- Sponsoring Organization:
- USDOE Assistant Secretary for Human Resources and Administration, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 296815
- Report Number(s):
- LA-UR-98-2443; CONF-980964-; ON: DE99001270; TRN: AHC29903%%213
- Resource Relation:
- Conference: 19. Risoe international symposium on materials science, Roskilde (Denmark), 7-11 Sep 1998; Other Information: PBD: [1998]
- Country of Publication:
- United States
- Language:
- English
Similar Records
Use of EBSD Data in Numerical Analyses
On the origin of the R orientation in the recrystallization textures of aluminum alloys